ENMA680

Prerequisite: ENMA650. Restriction: Permission of ENGR-Materials Science & Engineering department. Basic principles of electron microscopy theory, electron diffraction, and imaging theory. The electron beam sample interaction that gives rise to different signals is related to the structural and compositional information that is obtained from a sample using a TEM. The most common TEM techniques for structural characterization of a sample, namely, electron diffraction, bright/dark field imaging, and high resolution lattice imaging are discussed. Compositional information obtained from x-ray fluorescence and electron energy loss as well as the resolution of these techniques is also covered. A description of techniques used to study magnetic materials is also presented.