ENPM676

VLSI Testing and Design for Testability

Prerequisite: ENEE244; or students who have taken courses with comparable content may contact the department. An overview of VLSI test process and equipment, faults, fault modeling, fault simulation, combinational logi ATPG, sequential logic ATPG, Iddq testing, function testing, memory testing, delay testing, design for testability, BIST (Built-In Self-Test) and boundary scan.

Summer 2023

Manoj Franklin

39 reviews
Average rating: 3.05

Past Semesters

Manoj Franklin

39 reviews
Average rating: 3.05

Manoj Franklin

39 reviews
Average rating: 3.05

Include P/F semesters

* "W"s are considered to be 0.0 quality points. "Other" grades are not factored into GPA calculation. Grade data not guaranteed to be correct.