ENPM676
VLSI Testing and Design for Testability
Prerequisite: ENEE244; or students who have taken courses with comparable content may contact the department. An overview of VLSI test process and equipment, faults, fault modeling, fault simulation, combinational logi ATPG, sequential logic ATPG, Iddq testing, function testing, memory testing, delay testing, design for testability, BIST (Built-In Self-Test) and boundary scan.
Past Semesters
46 reviews
Average rating:
2.76
46 reviews
Average rating:
2.76
46 reviews
Average rating:
2.76