ENPM676

Prerequisite: ENEE244; or students who have taken courses with comparable content may contact the department. An overview of VLSI test process and equipment, faults, fault modeling, fault simulation, combinational logi ATPG, sequential logic ATPG, Iddq testing, function testing, memory testing, delay testing, design for testability, BIST (Built-In Self-Test) and boundary scan.